HgCdTe红外焦平面质子位移损伤效应研究
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作者单位:

1.中国科学院 新疆理化技术研究所;2.红外探测器技术航空科技重点实验室

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中图分类号:

TN432

基金项目:

航空科学基金(ASFC-202200240Z8001),中国科学院青年创新促进会(2021437),中国科学院重点部署基础科研项目(JCPYJJ-22011)


Research on the displacement damage effect of HgCdTe infraredfocal plane array induced by proton radiation
Author:
Affiliation:

1.Aviation Key Laboratory of Science and Technology on Infrared Detector;2.Xinjiang Technical Institute of Physics and Chemistry,Chinese Academy of Sciences

Fund Project:

Aviation Science Foundation(ASFC-202200240Z8001),The Youth Innovation Promotion Association of the Chinese Academy of Sciences (grant numbers 2021437),Key deployment projects of Chinese Academy of Sciences(grant number:JCPYJJ-22011)

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    摘要:

    针对红外探测器在空间应用中受高能粒子辐照导致性能衰退的问题,利用质子辐照实验,开展了位移损伤对HgCdTe红外焦平面关键参数影响的研究。通过对比辐照前后红外焦平面的性能变化,结合半导体辐射效应理论,分析了位移损伤对HgCdTe红外焦平面特性的影响机制。结果表明,HgCdTe红外焦平面经过质子辐照实验后,暗电流、噪声和盲元数量均有增大,增大的幅度随辐照注量的增大而增大。该工作可为深入开展HgCdTe红外探测器辐射损伤效应及损伤机理提供重要参考。

    Abstract:

    Aiming at the problem of performance degradation caused by the irradiation of high energy particles in the space application of infrared detectors, the influence of displacement damage on the key parameters of HgCdTe infrared focal plane is studied by proton irradiation experiment. By comparing the performance changes of the infrared focal plane before and after irradiation, combined with the theory of semiconductor radiation effect, the influence mechanism of displacement damage on the infrared focal plane characteristics of HgCdTe was analyzed. The results show that the dark current, noise and number of blind elements increase after proton irradiation, and the magnitude of degradation is in proportion to the radiation fluence. The results will provide helpful reference to the research of radiation effects of HgCdTe infrared detectors.

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  • 收稿日期:2025-04-14
  • 最后修改日期:2025-05-12
  • 录用日期:2025-05-20
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