For the problems that the traditional phase-shifting interferometry required multiple interferograms, which thus required high stability of the measurement equipment, resulting in slow phase extraction, a phase solving method of two-frame random phase-shifting interferograms based on the special extremum feature of the interferogram was proposed. This method required only two-frame interferograms. The two-frame interferograms with random phase shifting were processed separately by Gaussian high-pass filter to filter out their backgrounds. Then the phase shifting between these two interferograms was determined by a certain number of special extremum feature pixels in the interferogram. Finally, the phase of the interferogram was calculated according to the phase-shifting phase extraction algorithm of the arctangent function. The comparison results of simulation and actual measurement show that this method can obtain high-precision measurement phase through two-frame random phase-shifting interferograms, greatly reducing the influence of measurement system errors on the phase solving results. For the 256×256pixels interferogram of the eye part of the plaster model, the execution time is within 0.02s, which is fast for phase extraction.