(中国电子科技集团公司第五十五研究所, 南京 211100)
(The 55th Research Institute of China Electronics Technology Group Corporation, Nanjing 211100, CHN)
束名扬,周文,陈栋豪.掩模版复印工艺图形畸变分析与改进[J].半导体光电,2020,41(5):681-684. SHU Mingyang, ZHOU Wen, CHEN Donghao. Analysis and Improvement of the Graphic Distortion in Mask Copying Process[J].,2020,41(5):681-684.
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